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KMID : 0385520020150030236
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Analytical Science & Technology
2002 Volume.15 No. 3 p.236 ~ p.242
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The Studies of Conductive and Non-Conductive Multi-Layer Depth Analysis by Radio Frequency Gas-Jet Boosted Glow Discharge Atomic Emission Spectrometry
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조원보/Cho WB
이성훈/정종필/최우창/스튜어드 보든/김규환/김경미/김효진/정성욱/이중주/Lee SH/Jeong JP/Choi WC/Borden S/Kim KW/Kim KM/Kim HJ/Jeong SU/Lee JJ
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Abstract
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KEYWORD
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